Semiconductor Process Instruments
The HRF-1 Production Interferometer is a vertical format Fizeau Interferometer. It has
a rapid test plate change capability, a built in camera port with integral electronic
shutter, and easy adjustment to accommodate diffrent thickness parts. It is designed for
production optical shops and allows readings in seconds on its built in display screen.
Its camera port has a standard "T" mount for easy adaptation of film and CCD
cameras. The HRF1 can be supplied with a small base for direct mounting on standard
optical tables or with a larger base for free-standing application.
Figure 1: HRF-1 Interferometer CONTACT US For further
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The Hudson Research UFT-1 Universal Foucalt Tester is a precision
instrument designed to perform all classical optical bench tests. It incorporates a point
source arc lamp with adjustable slit as its source, and has a precision knife edge in a
rotary stage mount in its viewing system. The knife edge can be interchanged with a wire
for additional versatility. The precision rotary stage permits highly accurate and
repeatable measurement and determination of the various zones of the optical element under
test. This instrument was originally developed for in-house testing of the IR telescope
used in our Hyperspectral Imaging Spectroscope for the G-301 Space Shuttle Mission. It is
incorporated in our 3 Meter optical bench. The instrument can be supplied with or without
a bench and can be supplied with any standard optical bench mounting required.
Figure 2: UFT-1 Universal Foucalt Tester
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Hudson Research is pleased to offer the HIS-2 Hyperspectral Imaging Spectroscope as a
commercial product. The HIS-2 represents the state-of-the-art in multispectral imaging
systems. It is the first commercially available system to offer Sub-BLIP imaging with an
uncooled temperature. The ability to image objects that are colder than an uncooled
detector is unprecedented. The first Sub-BLIP
images that demonstrates this capability are presented at this web site The
instrument was originally designed for low earth orbit application, but its commercial
version can be customized to suit the users needs. The general specifications (maximum
values) are given in table 1 below.
Spectral Bandwidths and associated Window materials
Window Material KRS-5
Spectral Range: 0.5 microns - 25 microns
Window Material Diamond
Spectral Range: 0.1 microns - 80 microns
Window Material Enhanced Silicon
Spectral Range: 1.5 microns - 40 microns
Window Material Vacuum
Spectral Range: 30 GHz - 100 keV
General Secifications
Spectral Resolution: adjustable 32 - 150 nm
Number of Bands: 16 Filter Wheel Only; Continuous with Fabry-Perot; 4096 Maximum
Spectral Sensitivity: Shot-Noise Limited
Dynamic Range: >50,000:1
System Gain: >1024; digitally programable
Video Resolution: 4096 x 4096
Video Acquisition: Various Scan Sequences includiong Burst mode and continuous Mode
This diagram shows the general architecture of the HIS instrument.
Figure 3 HIS-2 Hyperspectral Imaging Spectroscope
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In response to demands from the imaging industry, we
have recently introduced the HRSP-1 Scanning Photometer. This instrument is designed to
perfom accurate linewidth measurements on CRT in the production environment. It has
numerous additional measurement and quality control applications. It features both Analog
and Digital readouts for rapid alignment and accurate measurements. It also has outputs
for plotters and an RS-232 output is optional. The unit is supplied with NIST traceable
calibration any one standard calibration scale. Foot-Lambert calibration is standard.
Control Head
